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Exploring Nano-Forces with DIFA’s Park NX10 Atomic Force Microscope

by Dr. Tobias Cramer

Dec 12, 2014 from 03:00 PM to 04:30 PM

Where Sala riunioni, I piano, viale Berti Pichat 6/2

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The Park NX10 Atomic Force Microscope allows to measure forces on organic field effect transistors during operation.


Atomic force microscopy (AFM) is a very high-resolution type of scanning probe microscopy, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. In this presentation I introduce to the newly acquired Park NX10 setup and explain measurements of Van-der-Waals and electrostatic forces in non-contact mode on selected examples (see figure).